Test Collections for Patent-to-Patent Retrieval and Patent Map Generation in NTCIR-4 Workshop

Atsushi Fujii, Makoto Iwayama, Noriko Kando


Anthology ID:
L04-1321
Volume:
Proceedings of the Fourth International Conference on Language Resources and Evaluation (LREC’04)
Month:
May
Year:
2004
Address:
Lisbon, Portugal
Editors:
Maria Teresa Lino, Maria Francisca Xavier, Fátima Ferreira, Rute Costa, Raquel Silva
Venue:
LREC
SIG:
Publisher:
European Language Resources Association (ELRA)
Note:
Pages:
Language:
URL:
http://www.lrec-conf.org/proceedings/lrec2004/pdf/526.pdf
DOI:
Bibkey:
Cite (ACL):
Atsushi Fujii, Makoto Iwayama, and Noriko Kando. 2004. Test Collections for Patent-to-Patent Retrieval and Patent Map Generation in NTCIR-4 Workshop. In Proceedings of the Fourth International Conference on Language Resources and Evaluation (LREC’04), Lisbon, Portugal. European Language Resources Association (ELRA).
Cite (Informal):
Test Collections for Patent-to-Patent Retrieval and Patent Map Generation in NTCIR-4 Workshop (Fujii et al., LREC 2004)
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PDF:
http://www.lrec-conf.org/proceedings/lrec2004/pdf/526.pdf